The emission of Auger electrons induced by energetic ions impact on Cr and Cr-silicides of different stoichiometry (Cr3Si and CrSi2) was investigated. Attention was focused on the origin, nature and characteristics of the metal peaks and on the role of asymmetric metal-silicon collision for the Cr and Si atom excitation. The ion excited, M23-related, low energy Cr spectrum essentially originates in the decay of slow sputtered Cr atoms. The Cr autoionization satellite almost completely vanishes, while interatomic transitions involving Cr and Ar atoms occur. Cr-Si collisions have been found to be efficient for the ionization of either Si and Cr atoms, indicating that excitation can also occur in the heavier partner.
ION BEAM-STIMULATED AUGER-ELECTRON EMISSION FROM CR AND CR-SILICIDES / Valeri, Sergio; Verucchi, R.. - In: PHYSICA SCRIPTA. - ISSN 1402-4896. - (1992), pp. 246-250.
ION BEAM-STIMULATED AUGER-ELECTRON EMISSION FROM CR AND CR-SILICIDES
VALERI, Sergio;
1992-01-01
Abstract
The emission of Auger electrons induced by energetic ions impact on Cr and Cr-silicides of different stoichiometry (Cr3Si and CrSi2) was investigated. Attention was focused on the origin, nature and characteristics of the metal peaks and on the role of asymmetric metal-silicon collision for the Cr and Si atom excitation. The ion excited, M23-related, low energy Cr spectrum essentially originates in the decay of slow sputtered Cr atoms. The Cr autoionization satellite almost completely vanishes, while interatomic transitions involving Cr and Ar atoms occur. Cr-Si collisions have been found to be efficient for the ionization of either Si and Cr atoms, indicating that excitation can also occur in the heavier partner.
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