Experimental and Simulation Studies of the Effects of Heavy-Ion Irradiation on HfO2-Based RRAM Cells

Alayan, M.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Larcher, L.; Vianello, E.; Nowak, E.; De Salvo, B.; Perniola, L.

doi:10.1109/TNS.2017.2721980

HfO2-based resistive RAMs have been irradiated with high-linear energy transfer heavy ions and subjected to an extensive characterization, showing that the cells are immune from upsets. No relevant changes were observed in the irradiated cells on resistance distribution and programming voltages. The irradiation experiment has been performed without any applied bias (retention mode). Reasons for the observed hardness are discussed using physics-based simulations. Moreover, simulations put in evidence that the cell might be sensitive if it is struck during a read operation, since the applied read voltage prevents the instantaneous recombination of the generated defects due to the Coulomb interaction between oxygen ions and vacancies.

Experimental and Simulation Studies of the Effects of Heavy-Ion Irradiation on HfO2-Based RRAM Cells / Alayan, M.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Larcher, L.; Vianello, E.; Nowak, E.; De Salvo, B.; Perniola, L.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 64:8(2017), pp. 2038-2045.

Data di pubblicazione:	2017
Titolo:	Experimental and Simulation Studies of the Effects of Heavy-Ion Irradiation on HfO2-Based RRAM Cells
Autore/i:	Alayan, M.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Larcher, L.; Vianello, E.; Nowak, E.; De Salvo, B.; Perniola, L.
Autore/i UNIMORE:	Alayan, M. Bagatin, M. Gerardin, S. Paccagnella, A. LARCHER, Luca Vianello, E. Nowak, E. De Salvo, B. Perniola, L. mostra contributor esterni nascondi contributor esterni
Digital Object Identifier (DOI):	http://dx.doi.org/10.1109/TNS.2017.2721980
Rivista:	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume:	64
Fascicolo:	8
Pagina iniziale:	2038
Pagina finale:	2045
Codice identificativo ISI:	WOS:000411034700006
Codice identificativo Scopus:	2-s2.0-85023760337
Citazione:	Experimental and Simulation Studies of the Effects of Heavy-Ion Irradiation on HfO2-Based RRAM Cells / Alayan, M.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Larcher, L.; Vianello, E.; Nowak, E.; De Salvo, B.; Perniola, L.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 64:8(2017), pp. 2038-2045.
Tipologia	Articolo su rivista

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