We study numerically a multichannel electronic Mach-Zender interferometer, where an orthogonal magnetic field produces edge states. Our time-dependent model is based on the split-step Fourier method and describes the charge carrier as a Gaussian wavepacket of edge states, whose path is defined by split-gate induced potential profiles on the 2DEG at filling factor 2. We analyse a beam splitter with ∼ 50% inter-channel mixing and obtain Aharonov-Bohm oscillations in the transmission probability of the second channel.

Dynamics of copropagating edge states in a multichannel Mach-Zender interferometer / Bellentani, L.; Beggi, A.; Bordone, P.; Bertoni, A.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 906:(2017), pp. 012027-1-012027-4. (Intervento presentato al convegno 20th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructures (EDISON20) tenutosi a Buffalo (NY), USA nel 16-21 luglio 2017) [10.1088/1742-6596/906/1/012027].

Dynamics of copropagating edge states in a multichannel Mach-Zender interferometer

L. Bellentani;A. Beggi;P. Bordone;
2017

Abstract

We study numerically a multichannel electronic Mach-Zender interferometer, where an orthogonal magnetic field produces edge states. Our time-dependent model is based on the split-step Fourier method and describes the charge carrier as a Gaussian wavepacket of edge states, whose path is defined by split-gate induced potential profiles on the 2DEG at filling factor 2. We analyse a beam splitter with ∼ 50% inter-channel mixing and obtain Aharonov-Bohm oscillations in the transmission probability of the second channel.
2017
20th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructures (EDISON20)
Buffalo (NY), USA
16-21 luglio 2017
906
012027-1
012027-4
Bellentani, L.; Beggi, A.; Bordone, P.; Bertoni, A.
Dynamics of copropagating edge states in a multichannel Mach-Zender interferometer / Bellentani, L.; Beggi, A.; Bordone, P.; Bertoni, A.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 906:(2017), pp. 012027-1-012027-4. (Intervento presentato al convegno 20th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructures (EDISON20) tenutosi a Buffalo (NY), USA nel 16-21 luglio 2017) [10.1088/1742-6596/906/1/012027].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1152668
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