We investigate numerically and experimentally the performance of an antireflection layer for solar cell applications, in an ordered nano-dots configuration realized by plasma etching of a GaSb substrate and subsequent PVD deposition of Ag nano- particles on the nano-dot tips, and in a non-ordered configuration of Ag islands deposited on flat GaSb, leading to a technique that can be readily applied to patterning of silicon. We measure the substrate reflectivity and model the reflection, absorption, and transmission of the substrates using the 3D-FDTD method, which are realistically represented from the microphotographs. Favourable conditions for broadband resonances and multiple absorption peaks by varying parameters such as nano-dots height and order/disorder are reported.
Optical response simulation and measurement of silver plasmonic nano-particles in hexagonal patterns for high-efficiency solar harvesting / Rosa, Lorenzo; Ranjan, M.; Zhou, J.; Fritzsche, M.; Facsko, S.; Mukherjee, S.; Juodkazis, S.. - (2012). (Intervento presentato al convegno 50th Annual Conference, Australian Solar Energy Society tenutosi a Melbourne, Australia nel December 2012).
Optical response simulation and measurement of silver plasmonic nano-particles in hexagonal patterns for high-efficiency solar harvesting
ROSA, Lorenzo;
2012
Abstract
We investigate numerically and experimentally the performance of an antireflection layer for solar cell applications, in an ordered nano-dots configuration realized by plasma etching of a GaSb substrate and subsequent PVD deposition of Ag nano- particles on the nano-dot tips, and in a non-ordered configuration of Ag islands deposited on flat GaSb, leading to a technique that can be readily applied to patterning of silicon. We measure the substrate reflectivity and model the reflection, absorption, and transmission of the substrates using the 3D-FDTD method, which are realistically represented from the microphotographs. Favourable conditions for broadband resonances and multiple absorption peaks by varying parameters such as nano-dots height and order/disorder are reported.Pubblicazioni consigliate
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