We present a multi-scale investigation of graphene-based transistors with a hexagonal boron-carbon-nitride (h-BCN) barrier in the channel. Our approach exploits ab-initio calculations for an accurate extraction of energy bands and tight-binding simulations in order to compute charge transport. We show that the h-BCN barrier inhibits the ambipolar behavior of graphene transistors, leading to a large Ion/Ioff ratio, within the ITRS roadmap specifications for future semiconductor technology nodes.

Nanodevices in flatland: Two-dimensional graphene-based transistors with high I on/I off ratio / Fiori, G., Betti, A., Bruzzone, S., D'Amico, P., Iannaccone, G.. - (2011), pp. 11.4.1-11.4.4. (2011 IEEE International Electron Devices Meeting, IEDM 2011 Washington, DC, usa 5-7 Dec. 2011) [10.1109/IEDM.2011.6131533].

Nanodevices in flatland: Two-dimensional graphene-based transistors with high I on/I off ratio

D'AMICO, PINO;
2011

Abstract

We present a multi-scale investigation of graphene-based transistors with a hexagonal boron-carbon-nitride (h-BCN) barrier in the channel. Our approach exploits ab-initio calculations for an accurate extraction of energy bands and tight-binding simulations in order to compute charge transport. We show that the h-BCN barrier inhibits the ambipolar behavior of graphene transistors, leading to a large Ion/Ioff ratio, within the ITRS roadmap specifications for future semiconductor technology nodes.
2011
no
Inglese
2011 IEEE International Electron Devices Meeting, IEDM 2011
Washington, DC, usa
5-7 Dec. 2011
Electron Devices Meeting (IEDM), 2011 IEEE International
11.4.1
11.4.4
9781457705052
IEEE
345 E 47TH ST, NEW YORK, NY 10017 USA
Internazionale
Electrical and Electronic Engineering; Condensed Matter Physics; Electronic, Optical and Magnetic Materials; Materials Chemistry2506 Metals and Alloys
Fiori, G; Betti, A.; Bruzzone, S.; D'Amico, Pino; Iannaccone, G.
Atti di CONVEGNO::Relazione in Atti di Convegno
273
5
Nanodevices in flatland: Two-dimensional graphene-based transistors with high I on/I off ratio / Fiori, G., Betti, A., Bruzzone, S., D'Amico, P., Iannaccone, G.. - (2011), pp. 11.4.1-11.4.4. (2011 IEEE International Electron Devices Meeting, IEDM 2011 Washington, DC, usa 5-7 Dec. 2011) [10.1109/IEDM.2011.6131533].
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info:eu-repo/semantics/conferenceObject
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1077503
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