This article reports on a facile and fast strategy for the self-assembled monolayer (SAM) functionalization of nickel surfaces, employing cyclic voltammetry (CV) cycling of a suitable tailored solution containing the species to be adsorbed. Results are presented for ultrathin films formed on Ni by 1-hexadecanethiol (C16), L-cysteine (L-cys), and the polymethyl (2R)-3-(2,2'-bithiophen-4-ylsulfanyl)-2-[(tert-butoxycarbonyl)amino]propanoate (PCT-L) thiophene-based chiral polymer. The effective formation of high-quality ultrathin organic films on the nickel was verified both electrochemically and by exploiting typical surface characterization techniques such as contact angle, ellipsometry, atomic force microscopy (AFM), polarization modulation-infrared reflection-absorption spectroscopy (PM-IRRAS), and X-ray photoelectron spectroscopy (XPS).
New one-step thiol functionalization procedure for Ni by self-assembled monolayers / Fontanesi, Claudio; Tassinari, Francesco; Parenti, Francesca; Cohen, Hagai; Mondal, Prakash Chandra; Kiran, Vankayala; Giglia, Angelo; Pasquali, Luca; Naaman, Ron. - In: LANGMUIR. - ISSN 0743-7463. - STAMPA. - 31:11(2015), pp. 3546-3552. [10.1021/acs.langmuir.5b00177]
New one-step thiol functionalization procedure for Ni by self-assembled monolayers
FONTANESI, Claudio
;TASSINARI, FRANCESCO;PARENTI, Francesca;PASQUALI, Luca;
2015
Abstract
This article reports on a facile and fast strategy for the self-assembled monolayer (SAM) functionalization of nickel surfaces, employing cyclic voltammetry (CV) cycling of a suitable tailored solution containing the species to be adsorbed. Results are presented for ultrathin films formed on Ni by 1-hexadecanethiol (C16), L-cysteine (L-cys), and the polymethyl (2R)-3-(2,2'-bithiophen-4-ylsulfanyl)-2-[(tert-butoxycarbonyl)amino]propanoate (PCT-L) thiophene-based chiral polymer. The effective formation of high-quality ultrathin organic films on the nickel was verified both electrochemically and by exploiting typical surface characterization techniques such as contact angle, ellipsometry, atomic force microscopy (AFM), polarization modulation-infrared reflection-absorption spectroscopy (PM-IRRAS), and X-ray photoelectron spectroscopy (XPS).File | Dimensione | Formato | |
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