The free-carrier-induced plasma excitation in delta-doped p-type GaAs(001) has been studied by means of high-resolution electron-energy-loss spectroscopy (HREELS). Several samples, with different values of doping and depth of the dopant layer, have been investigated at various primary-beam energies. The HREEL spectra show a strong dependence on the doping level. We were able to reproduce satisfactorily all the measured spectra using a suitable dielectric model of a classically confined free-carrier gas, pointing out the two-dimensional character of the free-carrier gas in the samples having the two lowest dopings. On the contrary, a characteristic three-dimensional behavior of the plasma excitation is exhibited by the most doped sample.
2D vs. 3D behaviour of free-carriers gas in delta-doped p-type GaAs(100) / BIAGI, Roberto; DEL PENNINO, Umberto. - In: PHYSICAL REVIEW. B, CONDENSED MATTER. - ISSN 0163-1829. - STAMPA. - 50(1994), pp. 7573-7581.
Data di pubblicazione: | 1994 |
Titolo: | 2D vs. 3D behaviour of free-carriers gas in delta-doped p-type GaAs(100). |
Autore/i: | BIAGI, Roberto; DEL PENNINO, Umberto |
Autore/i UNIMORE: | |
Rivista: | |
Volume: | 50 |
Pagina iniziale: | 7573 |
Pagina finale: | 7581 |
Codice identificativo ISI: | WOS:A1994PJ43700042 |
Codice identificativo Scopus: | 2-s2.0-0001428474 |
Codice identificativo Pubmed: | 9974739 |
Citazione: | 2D vs. 3D behaviour of free-carriers gas in delta-doped p-type GaAs(100) / BIAGI, Roberto; DEL PENNINO, Umberto. - In: PHYSICAL REVIEW. B, CONDENSED MATTER. - ISSN 0163-1829. - STAMPA. - 50(1994), pp. 7573-7581. |
Tipologia | Articolo su rivista |
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