PALUMBO, FRANCESCO
PALUMBO, FRANCESCO
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Defect spectroscopy from electrical measurements: A simulation based technique
2018-01-01 Larcher, L.; Padovani, A.; Pramanik, D.; Kaczer, B.; Palumbo, F.
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms
2019-01-01 Aguirre, F. L.; Padovani, A.; Ranjan, A.; Raghavan, N.; Vega, N.; Muller, N.; Matias Pazos, S.; Debray, M.; Molina, J.; Pey, K. L.; Palumbo, F.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Defect spectroscopy from electrical measurements: A simulation based technique | 1-gen-2018 | Larcher, L.; Padovani, A.; Pramanik, D.; Kaczer, B.; Palumbo, F. | |
| Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms | 1-gen-2019 | Aguirre, F. L.; Padovani, A.; Ranjan, A.; Raghavan, N.; Vega, N.; Muller, N.; Matias Pazos, S.; Debray, M.; Molina, J.; Pey, K. L.; Palumbo, F. |