PALUMBO, FRANCESCO
PALUMBO, FRANCESCO
Mostra
records
Risultati 1 - 3 di 3 (tempo di esecuzione: 0.008 secondi).
Defect spectroscopy from electrical measurements: A simulation based technique
2018 Larcher, L.; Padovani, A.; Pramanik, D.; Kaczer, B.; Palumbo, F.
Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller
2022 Pazos, S.; Zheng, W.; Zanotti, T.; Aguirre, F.; Becker, T.; Shen, Y.; Zhu, K.; Yuan, Y.; Wirth, G.; Puglisi, F. M.; Roldan, J. B.; Palumbo, F.; Lanza, M.
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms
2019 Aguirre, F. L.; Padovani, A.; Ranjan, A.; Raghavan, N.; Vega, N.; Muller, N.; Matias Pazos, S.; Debray, M.; Molina, J.; Pey, K. L.; Palumbo, F.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Defect spectroscopy from electrical measurements: A simulation based technique | 1-gen-2018 | Larcher, L.; Padovani, A.; Pramanik, D.; Kaczer, B.; Palumbo, F. | |
| Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller | 1-gen-2022 | Pazos, S.; Zheng, W.; Zanotti, T.; Aguirre, F.; Becker, T.; Shen, Y.; Zhu, K.; Yuan, Y.; Wirth, G.; Puglisi, F. M.; Roldan, J. B.; Palumbo, F.; Lanza, M. | |
| Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms | 1-gen-2019 | Aguirre, F. L.; Padovani, A.; Ranjan, A.; Raghavan, N.; Vega, N.; Muller, N.; Matias Pazos, S.; Debray, M.; Molina, J.; Pey, K. L.; Palumbo, F. |