Carrying out measurements of distances and thicknesses also in the presence of optical/electronic disturbances and noises and in industrial environments by means of interferometric optical retroreflection using incoherent light with superluminescent diodes.
INTERFEROMETRICAL, OPTICAL RETROREFLECTION WITH LOW COHERENCE SOURCE / Rovati, Luigi. - 3 No. 5:, pp. 30-30.
INTERFEROMETRICAL, OPTICAL RETROREFLECTION WITH LOW COHERENCE SOURCE
ROVATI, Luigi
Abstract
Carrying out measurements of distances and thicknesses also in the presence of optical/electronic disturbances and noises and in industrial environments by means of interferometric optical retroreflection using incoherent light with superluminescent diodes.
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