COSTANTINI, FELIPE
COSTANTINI, FELIPE
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Monitoring Stress-Induced Defects in HK/MG FinFETs Using Random Telegraph Noise
2016 Puglisi, Francesco Maria; Costantini, Felipe; Kaczer, Ben; Larcher, Luca; Pavan, Paolo
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization
2016 Puglisi, Francesco Maria; Costantini, Felipe; Kaczer, Ben; Larcher, Luca; Pavan, Paolo
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Monitoring Stress-Induced Defects in HK/MG FinFETs Using Random Telegraph Noise | 1-gen-2016 | Puglisi, Francesco Maria; Costantini, Felipe; Kaczer, Ben; Larcher, Luca; Pavan, Paolo | |
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization | 1-gen-2016 | Puglisi, Francesco Maria; Costantini, Felipe; Kaczer, Ben; Larcher, Luca; Pavan, Paolo |