A polarimetric measurement technique based on the analysis of the reflection data given by a single mirror rotated around the incidence beam axis is presented. In the extreme ultraviolet spectral region, a multilayer coated mirror must be used. The multilayer mirror must be fully characterized before the experiment. Theory demonstrates how this method allows complete determination of Stoke's parameters in case of a totally polarized beam. A simulation code has been developed in order to model the experiment in case of synchrotron radiation propagating in a bending magnet beamline and impinging a multilayer mirror. The simulation is useful to verify each time the effectiveness of the method in the different experimental conditions considered. Finally an experimental application is presented.

EUV Polarimetry with single multilayer optical elementProceedings of SPIE / Sara, Zuccon; Maria Guglielmina, Pelizzo; P., Nicolosi; A., Giglia; N., Mahne; Nannarone, Stefano. - STAMPA. - 7077:(2008), pp. 70771R-70771R-13. (Intervento presentato al convegno 3rd Conference on Advances in X-Ray/EUV Optics and Components tenutosi a San Diego, CA nel AUG 11-13, 2008) [10.1117/12.791907].

EUV Polarimetry with single multilayer optical elementProceedings of SPIE

NANNARONE, Stefano
2008

Abstract

A polarimetric measurement technique based on the analysis of the reflection data given by a single mirror rotated around the incidence beam axis is presented. In the extreme ultraviolet spectral region, a multilayer coated mirror must be used. The multilayer mirror must be fully characterized before the experiment. Theory demonstrates how this method allows complete determination of Stoke's parameters in case of a totally polarized beam. A simulation code has been developed in order to model the experiment in case of synchrotron radiation propagating in a bending magnet beamline and impinging a multilayer mirror. The simulation is useful to verify each time the effectiveness of the method in the different experimental conditions considered. Finally an experimental application is presented.
2008
3rd Conference on Advances in X-Ray/EUV Optics and Components
San Diego, CA
AUG 11-13, 2008
7077
70771R
70771R-13
Sara, Zuccon; Maria Guglielmina, Pelizzo; P., Nicolosi; A., Giglia; N., Mahne; Nannarone, Stefano
EUV Polarimetry with single multilayer optical elementProceedings of SPIE / Sara, Zuccon; Maria Guglielmina, Pelizzo; P., Nicolosi; A., Giglia; N., Mahne; Nannarone, Stefano. - STAMPA. - 7077:(2008), pp. 70771R-70771R-13. (Intervento presentato al convegno 3rd Conference on Advances in X-Ray/EUV Optics and Components tenutosi a San Diego, CA nel AUG 11-13, 2008) [10.1117/12.791907].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/743040
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