An experimental investigation has been carried out to study variations of microstructure, composition., and electrical properties (sheet resistance and its temp. coefficient) occurring in thick-film (cermet) resistors during the annealing process which transforms the initial ink into a resistive layer. Resistors based on Bi2Ru2O7 and a lead silica glass have been studied. Analyses have been performed on the inks using thermogravimetric measurements, and on annealed (fired) layers by means of x-ray diffraction, atomic absorption, electron microscopy, microprobe analysis, and other complementary techniques. The results point out the role of exchange reactions and redox reactions inside the resistor body and emphasize the complexity of the phenomena which concur to define the final elecrical properties of these resistive systems. Interrelations between microstructure, composition , and elecrical properties have been found and tentative explanations proposed.

Evolution of ruthenate-based thick-film cermet resistors / Morten, Bruno; Masoero, A.; Prudenziati, Maria; Manfredini, Tiziano. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - STAMPA. - 27:(1994), pp. 2227-2235.

Evolution of ruthenate-based thick-film cermet resistors

MORTEN, Bruno;PRUDENZIATI, Maria;MANFREDINI, Tiziano
1994

Abstract

An experimental investigation has been carried out to study variations of microstructure, composition., and electrical properties (sheet resistance and its temp. coefficient) occurring in thick-film (cermet) resistors during the annealing process which transforms the initial ink into a resistive layer. Resistors based on Bi2Ru2O7 and a lead silica glass have been studied. Analyses have been performed on the inks using thermogravimetric measurements, and on annealed (fired) layers by means of x-ray diffraction, atomic absorption, electron microscopy, microprobe analysis, and other complementary techniques. The results point out the role of exchange reactions and redox reactions inside the resistor body and emphasize the complexity of the phenomena which concur to define the final elecrical properties of these resistive systems. Interrelations between microstructure, composition , and elecrical properties have been found and tentative explanations proposed.
1994
27
2227
2235
Evolution of ruthenate-based thick-film cermet resistors / Morten, Bruno; Masoero, A.; Prudenziati, Maria; Manfredini, Tiziano. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - STAMPA. - 27:(1994), pp. 2227-2235.
Morten, Bruno; Masoero, A.; Prudenziati, Maria; Manfredini, Tiziano
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/598152
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