The paper reports results of an investigation on the main measurement uncertainty sources in a novel distance meter based on dispersive comb-spectrum interferometry. The light source is a commercial laser diode operating at 670 nm driven ender the threshold condition, and emitting a beam with a comb-shaped spectrum. Sensitivity of the measurement to the operating conditions has been evaluated. Results from an experimental activity aimed at characterizing the laser and to measure the performance of a prototype implementation are also presented. The system is suitable to perform unambiguous non-incremental distance measurements over a range of 0.8 mm with a total uncertainty of about 1.5 um
Metrological characterization of a novel absolute distance meter based on dispersive comb-spectrum interferometry / U., Minoni; Rovati, Luigi; M., Bonardi; F., Docchio. - STAMPA. - 2:(1998), pp. 1137-1140. (Intervento presentato al convegno Instrumentation and Measurement Technology Conference, 1998. IMTC/98 tenutosi a USA nel 1998-May).
Metrological characterization of a novel absolute distance meter based on dispersive comb-spectrum interferometry
ROVATI, Luigi;
1998
Abstract
The paper reports results of an investigation on the main measurement uncertainty sources in a novel distance meter based on dispersive comb-spectrum interferometry. The light source is a commercial laser diode operating at 670 nm driven ender the threshold condition, and emitting a beam with a comb-shaped spectrum. Sensitivity of the measurement to the operating conditions has been evaluated. Results from an experimental activity aimed at characterizing the laser and to measure the performance of a prototype implementation are also presented. The system is suitable to perform unambiguous non-incremental distance measurements over a range of 0.8 mm with a total uncertainty of about 1.5 umPubblicazioni consigliate
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