Visibilities are calibrated measurements of sampled Fourier components of a source distribution. In astronomical imaging they are provided, for instance, by rotation modulationcollimators in X-ray imaging or by pairs of antennas in a radio interferometer. Here we present a novel technique which allows the imaging of important physical parameters in the source fromthe analysis of measured visibilities. This method is based on the application of a regularization approach in the spatial frequency domain. We show its effectiveness in an application to X-raysolar imaging spectroscopy with real visibilities measured by the Reuven Ramaty High Energy Solar Spectroscopy Imager (RHESSI).

Parametrical imaging in solar astronomy using visibilities / M., Piana; A. M., Massone; A. G., Emslie; G. J., Hurford; E. P., Kontar; Prato, Marco; R. A., Schwartz. - ELETTRONICO. - 1:(2008), pp. 779-779. (Intervento presentato al convegno Progress In Electromagnetics Research Symposium 2008 tenutosi a Hangzhou (Cina) nel 24-28 marzo 2008).

Parametrical imaging in solar astronomy using visibilities

PRATO, Marco;
2008

Abstract

Visibilities are calibrated measurements of sampled Fourier components of a source distribution. In astronomical imaging they are provided, for instance, by rotation modulationcollimators in X-ray imaging or by pairs of antennas in a radio interferometer. Here we present a novel technique which allows the imaging of important physical parameters in the source fromthe analysis of measured visibilities. This method is based on the application of a regularization approach in the spatial frequency domain. We show its effectiveness in an application to X-raysolar imaging spectroscopy with real visibilities measured by the Reuven Ramaty High Energy Solar Spectroscopy Imager (RHESSI).
2008
Progress In Electromagnetics Research Symposium 2008
Hangzhou (Cina)
24-28 marzo 2008
M., Piana; A. M., Massone; A. G., Emslie; G. J., Hurford; E. P., Kontar; Prato, Marco; R. A., Schwartz
Parametrical imaging in solar astronomy using visibilities / M., Piana; A. M., Massone; A. G., Emslie; G. J., Hurford; E. P., Kontar; Prato, Marco; R. A., Schwartz. - ELETTRONICO. - 1:(2008), pp. 779-779. (Intervento presentato al convegno Progress In Electromagnetics Research Symposium 2008 tenutosi a Hangzhou (Cina) nel 24-28 marzo 2008).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/592129
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