The light sensitivity of gate-lag transients and current-DLTS signals is experimentally analyzed in AlGaAs-GaAs HFETs and reproduced by 2D device simulations attributing the observed behaviors to the hole-trap performance of surface deep levels.

Light sensitivity of gate lag and current DLTS as a tool to investigate the origin of dc-to-RF dispersion effects in GaAs heterostructure FETs / Basile, Alberto Francesco; Verzellesi, Giovanni; Canali, Claudio; A., Cavallini; A., Castaldini; C., Lanzieri. - STAMPA. - (2004). (Intervento presentato al convegno European Workshop on Heterostructure Technology tenutosi a Koutouloufari (Creete, Greece) nel Oct. 2004).

Light sensitivity of gate lag and current DLTS as a tool to investigate the origin of dc-to-RF dispersion effects in GaAs heterostructure FETs

BASILE, Alberto Francesco;VERZELLESI, Giovanni;CANALI, Claudio;
2004

Abstract

The light sensitivity of gate-lag transients and current-DLTS signals is experimentally analyzed in AlGaAs-GaAs HFETs and reproduced by 2D device simulations attributing the observed behaviors to the hole-trap performance of surface deep levels.
2004
European Workshop on Heterostructure Technology
Koutouloufari (Creete, Greece)
Oct. 2004
Basile, Alberto Francesco; Verzellesi, Giovanni; Canali, Claudio; A., Cavallini; A., Castaldini; C., Lanzieri
Light sensitivity of gate lag and current DLTS as a tool to investigate the origin of dc-to-RF dispersion effects in GaAs heterostructure FETs / Basile, Alberto Francesco; Verzellesi, Giovanni; Canali, Claudio; A., Cavallini; A., Castaldini; C., Lanzieri. - STAMPA. - (2004). (Intervento presentato al convegno European Workshop on Heterostructure Technology tenutosi a Koutouloufari (Creete, Greece) nel Oct. 2004).
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

Licenza Creative Commons
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/467039
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact