The sensitivity of InGaAsP/InP buried crescent lasers to ESD phenomena was deeply analysed, starting from the need to explain and prevent sudden failures during equipment manufacturing and test.
ESD induced degradation mechanisms of InGaAsP lasers / F., Magistrali; D., Sala; G., Salmini; M., Vanzi; Fantini, Fausto; M., Giansante; L., Zazzetti. - In: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL. - ISSN 0748-8017. - STAMPA. - 8:(1992), pp. 287-293.
ESD induced degradation mechanisms of InGaAsP lasers
FANTINI, Fausto;
1992
Abstract
The sensitivity of InGaAsP/InP buried crescent lasers to ESD phenomena was deeply analysed, starting from the need to explain and prevent sudden failures during equipment manufacturing and test.
Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris
