In this paper we demonstrate the straight correlation between the integrated light emitted and the DC currents in GaAs-based pseudomorphic HEMTs biased at huigh drain voltage, when, due to hot electrons. impact ionization takes place.
Correlation between light emission and currents in pseudomorphic HEMTs / Cova, P.; Fantini, Fausto; Manfredi, M.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 38:(1998), pp. 507-510.
Correlation between light emission and currents in pseudomorphic HEMTs
FANTINI, Fausto;
1998
Abstract
In this paper we demonstrate the straight correlation between the integrated light emitted and the DC currents in GaAs-based pseudomorphic HEMTs biased at huigh drain voltage, when, due to hot electrons. impact ionization takes place.
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