Presents a design and screening approach that can be adopted to improve reliability of high-power 980-nm semiconductor lasers. Flared-ridge waveguide chips were realized on GRIN-SCH single-quantum-well structures. Without any screening, flared devices, thanks to the reduced peak power and current density, showed a 20% reduction in failure rate with respect to devices with straight waveguide. By adopting extended screening criteria, a more reliable population was selected, showing a reduction by a factor of two in the failure rate extrapolated at standard operating conditions.
Design and screening of highly reliable 980nm pump lasers / G., Ghislotti; Fantini, Fausto. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - STAMPA. - 2:2(2002), pp. 26-29. [10.1109/TDMR.2002.802026]
Design and screening of highly reliable 980nm pump lasers
FANTINI, Fausto
2002
Abstract
Presents a design and screening approach that can be adopted to improve reliability of high-power 980-nm semiconductor lasers. Flared-ridge waveguide chips were realized on GRIN-SCH single-quantum-well structures. Without any screening, flared devices, thanks to the reduced peak power and current density, showed a 20% reduction in failure rate with respect to devices with straight waveguide. By adopting extended screening criteria, a more reliable population was selected, showing a reduction by a factor of two in the failure rate extrapolated at standard operating conditions.Pubblicazioni consigliate
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