Testing may be more expensive for EPROMs than for other memories, because program and erasure cycles are much longer than read cycles, and therefore the test procedure must not include more than one program and one erasure step. In this paper EPROM operation is modeled by a sequential machine those state and output equations are derived according to boolean matrix algebra.

EPROM testing - part I: theoretical considerations / Alliney, S.; Fantini, Fausto; Morandi, C.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 22:(1982), pp. 965-986.

EPROM testing - part I: theoretical considerations

FANTINI, Fausto;
1982

Abstract

Testing may be more expensive for EPROMs than for other memories, because program and erasure cycles are much longer than read cycles, and therefore the test procedure must not include more than one program and one erasure step. In this paper EPROM operation is modeled by a sequential machine those state and output equations are derived according to boolean matrix algebra.
1982
22
965
986
EPROM testing - part I: theoretical considerations / Alliney, S.; Fantini, Fausto; Morandi, C.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 22:(1982), pp. 965-986.
Alliney, S.; Fantini, Fausto; Morandi, C.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/451734
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