A HEMT transistor of the normally off type, including: a semiconductor heterostructure, which comprises at least one first layer and one second layer, the second layer being set on top of the first layer; a trench, which extends through the second layer and a portion of the first layer; a gate region of conductive material, which extends in the trench; and a dielectric region, which extends in the trench, coats the gate region, and contacts the semiconductor heterostructure. A part of the trench is delimited laterally by a lateral structure that forms at least one first step. The semiconductor heterostructure forms a first edge and a second edge of the first step, the first edge being formed by the first layer.

HEMT transistor of the normally off type including a trench containing a gate region and forming at least one step, and corresponding manufacturing method / Iucolano, Ferdinando; Patti, Alfonso; Chini, Alessandro. - (2016 May 19).

HEMT transistor of the normally off type including a trench containing a gate region and forming at least one step, and corresponding manufacturing method

Alessandro Chini
2016

Abstract

A HEMT transistor of the normally off type, including: a semiconductor heterostructure, which comprises at least one first layer and one second layer, the second layer being set on top of the first layer; a trench, which extends through the second layer and a portion of the first layer; a gate region of conductive material, which extends in the trench; and a dielectric region, which extends in the trench, coats the gate region, and contacts the semiconductor heterostructure. A part of the trench is delimited laterally by a lateral structure that forms at least one first step. The semiconductor heterostructure forms a first edge and a second edge of the first step, the first edge being formed by the first layer.
19-mag-2016
31-dic-2019
STMicroelectronics SRL
US10522646B2
Internazionale
Iucolano, Ferdinando; Patti, Alfonso; Chini, Alessandro
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1190101
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