The development of accurate absolute distance interferometers is a long-term research goal. The key impact of this paper is the development of an absolute distance interferometer based on the optical feedback into a superluminescent diode cavity. The proposed approach employs a two arms interferometer feeds by a superluminescent diode. Thanks to the optical feedback, we obtained huge interference fringes even with diffusive targets. The proposed signal processing exploits a zero-crossing approach to determine the absolute target position. Preliminary results show a ratio between measurement uncertainty and range of about 50 ppm.

Optical feedback into a superluminescent diode cavity for absolute distance measurements / Rovati, L.; Cecilia, L. D.; Cattini, S.. - 2019-:(2019), pp. 455-459. (Intervento presentato al convegno 2019 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019 tenutosi a nzl nel 2019) [10.1109/I2MTC.2019.8826828].

Optical feedback into a superluminescent diode cavity for absolute distance measurements

Rovati L.
;
Cattini S.
2019

Abstract

The development of accurate absolute distance interferometers is a long-term research goal. The key impact of this paper is the development of an absolute distance interferometer based on the optical feedback into a superluminescent diode cavity. The proposed approach employs a two arms interferometer feeds by a superluminescent diode. Thanks to the optical feedback, we obtained huge interference fringes even with diffusive targets. The proposed signal processing exploits a zero-crossing approach to determine the absolute target position. Preliminary results show a ratio between measurement uncertainty and range of about 50 ppm.
2019
2019 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019
nzl
2019
2019-
455
459
Rovati, L.; Cecilia, L. D.; Cattini, S.
Optical feedback into a superluminescent diode cavity for absolute distance measurements / Rovati, L.; Cecilia, L. D.; Cattini, S.. - 2019-:(2019), pp. 455-459. (Intervento presentato al convegno 2019 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019 tenutosi a nzl nel 2019) [10.1109/I2MTC.2019.8826828].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1188081
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