A general-purpose system for fast, automated acquisition of the S-parameters of three-port components is described, which is suitable for accurate device characterization as well as RF testing of three-port circuits in a production environment. Though based on conventional, nonrepeatable, electromechanical switches, the system achieves state of the art accuracy for on-wafer measurements by means of suitable hardware design and the application of time-domain gating. The system is applied to the characterization of MMIC (monolithic microwave IC) T-coils and single-pole double-throw (SPDT) switches. The bandwidth is now limited to 20 GHz but can be easily upgraded to 26.5 GHz by replacing one of the switches. Acquisition of the corrected S-parameters takes about 15 seconds (51 frequency points) with a HP 9000/330 controller.

An accurate System for automated On-wafer Characterization of Three-port Devices / Selmi, Luca; Estreich, D. B.. - STAMPA. - (1990), pp. 343-346. (Intervento presentato al convegno IEEE GaAs IC Symposium tenutosi a New Orleans, LA, USA nel 7-10 Ottobre 1990) [10.109/GAAS.1990.175525].

An accurate System for automated On-wafer Characterization of Three-port Devices

SELMI, Luca;
1990

Abstract

A general-purpose system for fast, automated acquisition of the S-parameters of three-port components is described, which is suitable for accurate device characterization as well as RF testing of three-port circuits in a production environment. Though based on conventional, nonrepeatable, electromechanical switches, the system achieves state of the art accuracy for on-wafer measurements by means of suitable hardware design and the application of time-domain gating. The system is applied to the characterization of MMIC (monolithic microwave IC) T-coils and single-pole double-throw (SPDT) switches. The bandwidth is now limited to 20 GHz but can be easily upgraded to 26.5 GHz by replacing one of the switches. Acquisition of the corrected S-parameters takes about 15 seconds (51 frequency points) with a HP 9000/330 controller.
1990
IEEE GaAs IC Symposium
New Orleans, LA, USA
7-10 Ottobre 1990
343
346
Selmi, Luca; Estreich, D. B.
An accurate System for automated On-wafer Characterization of Three-port Devices / Selmi, Luca; Estreich, D. B.. - STAMPA. - (1990), pp. 343-346. (Intervento presentato al convegno IEEE GaAs IC Symposium tenutosi a New Orleans, LA, USA nel 7-10 Ottobre 1990) [10.109/GAAS.1990.175525].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1163466
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