An experimental investigation on the interaction between different parasitic devices in CMOS ICs from the point of view of latchup triggering is outlined. The study, carried out by means of ad hoc test structures, shows that this interaction: (a) can lead to significant increase in latchup susceptibility; (b) can involve devices very distant from one another; and (c) is not always suppressed by guard ring protections. The main features of the experimental results are discussed and explained

Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs / Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - 38:8(1991), pp. 1978-1981. [10.1109/16.119047]

Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs

SELMI, Luca;
1991

Abstract

An experimental investigation on the interaction between different parasitic devices in CMOS ICs from the point of view of latchup triggering is outlined. The study, carried out by means of ad hoc test structures, shows that this interaction: (a) can lead to significant increase in latchup susceptibility; (b) can involve devices very distant from one another; and (c) is not always suppressed by guard ring protections. The main features of the experimental results are discussed and explained
1991
38
8
1978
1981
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs / Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - 38:8(1991), pp. 1978-1981. [10.1109/16.119047]
Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1163046
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