Sfoglia per Autore
Three dimensional distribution of latch-up current in scaled CMOS structures
1987 Selmi, Luca; Venturi, F; Sangiorgi, Enrico; Ricco, B.
Three dimensional distribution of CMOS Latch-up current
1987 Sangiorgi, E; Ricco, B; Selmi, Luca
Hysteresis cycle in the Latch-up characteristic of wide CMOS structures
1988 Selmi, Luca; Sangiorgi, Enrico; Crisenza, G; Re, D; Ricco, B.
A novel method to determine the Source and Drain resistances of individual MOSFETs
1988 Ricco, B; Selmi, Luca; Sangiorgi, Enrico
Layout Dependence of CMOS Latchup
1988 Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Crisenza, G; Cavioni, T; Ricco, B.
Parameter extraction from I-V characteristics of single MOSFETs
1989 Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
Hot-Electron induced Photon Energies in n-channel MOSFET’s operating at 77 and 300 K
1989 Lanzoni, M; Manfredi, M; Selmi, Luca; Sangiorgi, Enrico; Cappelletti, R; Ricco, B.
Three dimensional effects in dynamically triggered CMOS latch-up
1989 Fiegna, C; Selmi, Luca; Sangiorgi, E; Ricco, B.
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs
1990 Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
An accurate System for automated On-wafer Characterization of Three-port Devices
1990 Selmi, Luca; Estreich, D. B.
Latch-up in CMOS circuits: a review
1990 Sangiorgi, Enrico; Fiegna, C; Menozzi, R; Selmi, Luca; Ricco, B.
An improved procedure to test CMOS ICs for Latch-up
1990 Menozzi, R; Lanzoni, M; Selmi, Luca; Ricco, B.
Adjacent structure interactions in latch-up dc triggering of CMOS twin-tub and epitaxial technologies
1991 Pavan, Paolo; Zanoni, E.; Menozzi, R.; Selmi, L.
Application of Bridged T-coils to the design of Multiplicative Gain MMIC Amplifiers
1991 Selmi, Luca; Estreich, D; Ricco, B.
Logiche di tipo BiCMOS
1991 B., Riccò; M., Favalli; Selmi, Luca
Adjacent structure interactions in the Latch-up triggering of CMOS twin-tub and epitaxial technologies
1991 Pavan, P; Zanoni, E; Menozzi, R; Selmi, Luca
Extraction of the Series Resistances and Effective Channel Length of GaAs MESFETs by means of Electrical Methods
1991 Menozzi, R; Selmi, Luca; Gandolfi, A; Ricco, B.
Thermal Characterization of GaAs MESFETs by means of Pulsed Measurements
1991 Selmi, Luca; Ricco, B.
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs
1991 Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
Problematiche di affidabilità
1992 Selmi, Luca
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