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Titolo Data di pubblicazione Autore(i) File
Three dimensional distribution of latch-up current in scaled CMOS structures 1-gen-1987 Selmi, Luca; Venturi, F; Sangiorgi, Enrico; Ricco, B.
Three dimensional distribution of CMOS Latch-up current 1-gen-1987 Sangiorgi, E; Ricco, B; Selmi, Luca
Hysteresis cycle in the Latch-up characteristic of wide CMOS structures 1-gen-1988 Selmi, Luca; Sangiorgi, Enrico; Crisenza, G; Re, D; Ricco, B.
A novel method to determine the Source and Drain resistances of individual MOSFETs 1-gen-1988 Ricco, B; Selmi, Luca; Sangiorgi, Enrico
Layout Dependence of CMOS Latchup 1-gen-1988 Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Crisenza, G; Cavioni, T; Ricco, B.
Parameter extraction from I-V characteristics of single MOSFETs 1-gen-1989 Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
Hot-Electron induced Photon Energies in n-channel MOSFET’s operating at 77 and 300 K 1-gen-1989 Lanzoni, M; Manfredi, M; Selmi, Luca; Sangiorgi, Enrico; Cappelletti, R; Ricco, B.
Three dimensional effects in dynamically triggered CMOS latch-up 1-gen-1989 Fiegna, C; Selmi, Luca; Sangiorgi, E; Ricco, B.
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 1-gen-1990 Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
An accurate System for automated On-wafer Characterization of Three-port Devices 1-gen-1990 Selmi, Luca; Estreich, D. B.
Latch-up in CMOS circuits: a review 1-gen-1990 Sangiorgi, Enrico; Fiegna, C; Menozzi, R; Selmi, Luca; Ricco, B.
An improved procedure to test CMOS ICs for Latch-up 1-gen-1990 Menozzi, R; Lanzoni, M; Selmi, Luca; Ricco, B.
Adjacent structure interactions in latch-up dc triggering of CMOS twin-tub and epitaxial technologies 1-gen-1991 Pavan, Paolo; Zanoni, E.; Menozzi, R.; Selmi, L.
Application of Bridged T-coils to the design of Multiplicative Gain MMIC Amplifiers 1-gen-1991 Selmi, Luca; Estreich, D; Ricco, B.
Logiche di tipo BiCMOS 1-gen-1991 B., Riccò; M., Favalli; Selmi, Luca
Adjacent structure interactions in the Latch-up triggering of CMOS twin-tub and epitaxial technologies 1-gen-1991 Pavan, P; Zanoni, E; Menozzi, R; Selmi, Luca
Extraction of the Series Resistances and Effective Channel Length of GaAs MESFETs by means of Electrical Methods 1-gen-1991 Menozzi, R; Selmi, Luca; Gandolfi, A; Ricco, B.
Thermal Characterization of GaAs MESFETs by means of Pulsed Measurements 1-gen-1991 Selmi, Luca; Ricco, B.
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 1-gen-1991 Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
Problematiche di affidabilità 1-gen-1992 Selmi, Luca
Mostrati risultati da 1 a 20 di 453
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