Sfoglia per Autore
Random Telegraph Signal Noise Properties of HfOx RRAM in High Resistive States
2012 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca; G., Bersuker
FHMM analysis for Multi-Defect Spectroscopy in HfOX RRAM
2013 Puglisi, Francesco Maria; Pavan, Paolo
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS
2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM
2013 PUGLISI, Francesco Maria; PAVAN, Paolo
RTS Noise Characterization of HfOx RRAM in High Resistive State
2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca; G., Bersuker
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory
2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
Perimeter and area current components in HfO2 and HfO2-x metal-insulator-metal capacitors
2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
An Empirical Model for RRAM Resistance in Low- and High-Resistance State
2013 Puglisi, Francesco Maria; Larcher, Luca; G., Bersuker; Padovani, Andrea; Pavan, Paolo
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods
2014 Puglisi, Francesco Maria; Veksler, D.; Matthews, K.; Bersuker, G.; Larcher, Luca; Padovani, Andrea; Vandelli, Luca; Pavan, Paolo
Progresses in Modeling HfOx RRAM Operations and Variability
2014 Larcher, Luca; Pirrotta, Onofrio; Puglisi, Francesco Maria; Padovani, Andrea; Pavan, Paolo; Vandelli, Luca
Factorial Hidden Markov Model analysis of Random Telegraph Noise in Resistive Random Access Memories
2014 Puglisi, Francesco Maria; Pavan, Paolo
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS
2014 Puglisi, Francesco Maria; Pavan, Paolo; Larcher, Luca; Padovani, Andrea
An investigation on the role of current compliance in HfO2-based RRAM in HRS using RTN and I-V data
2014 Puglisi, Francesco Maria; Pavan, Paolo
Instability of HfO2 RRAM devices: Comparing RTN and cycling variability
2014 Puglisi, Francesco Maria; Larcher, Luca; Pavan, Paolo; Padovani, Andrea; Bersuker, G.
A study on HfO2 RRAM in HRS based on I–V and RTN analysis
2014 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis
2014 Larcher, Luca; Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Vandelli, Luca; Bersuker, Gennadi
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory
2015 Puglisi, Francesco Maria; Larcher, Luca; Padovani, Andrea; Pavan, Paolo
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM
2015 Puglisi, Francesco Maria; Wenger, C.; Pavan, Paolo
A microscopic physical description of RTN current fluctuations in HfOx RRAM
2015 Puglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca
Temperature impact on the reset operation in HfO2 RRAM
2015 Puglisi, Francesco Maria; Qafa, Altin; Pavan, Paolo
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Random Telegraph Signal Noise Properties of HfOx RRAM in High Resistive States | 1-gen-2012 | Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca; G., Bersuker | |
FHMM analysis for Multi-Defect Spectroscopy in HfOX RRAM | 1-gen-2013 | Puglisi, Francesco Maria; Pavan, Paolo | |
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS | 1-gen-2013 | Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca | |
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM | 1-gen-2013 | PUGLISI, Francesco Maria; PAVAN, Paolo | |
RTS Noise Characterization of HfOx RRAM in High Resistive State | 1-gen-2013 | Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca; G., Bersuker | |
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory | 1-gen-2013 | Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca | |
Perimeter and area current components in HfO2 and HfO2-x metal-insulator-metal capacitors | 1-gen-2013 | Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca | |
An Empirical Model for RRAM Resistance in Low- and High-Resistance State | 1-gen-2013 | Puglisi, Francesco Maria; Larcher, Luca; G., Bersuker; Padovani, Andrea; Pavan, Paolo | |
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods | 1-gen-2014 | Puglisi, Francesco Maria; Veksler, D.; Matthews, K.; Bersuker, G.; Larcher, Luca; Padovani, Andrea; Vandelli, Luca; Pavan, Paolo | |
Progresses in Modeling HfOx RRAM Operations and Variability | 1-gen-2014 | Larcher, Luca; Pirrotta, Onofrio; Puglisi, Francesco Maria; Padovani, Andrea; Pavan, Paolo; Vandelli, Luca | |
Factorial Hidden Markov Model analysis of Random Telegraph Noise in Resistive Random Access Memories | 1-gen-2014 | Puglisi, Francesco Maria; Pavan, Paolo | |
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS | 1-gen-2014 | Puglisi, Francesco Maria; Pavan, Paolo; Larcher, Luca; Padovani, Andrea | |
An investigation on the role of current compliance in HfO2-based RRAM in HRS using RTN and I-V data | 1-gen-2014 | Puglisi, Francesco Maria; Pavan, Paolo | |
Instability of HfO2 RRAM devices: Comparing RTN and cycling variability | 1-gen-2014 | Puglisi, Francesco Maria; Larcher, Luca; Pavan, Paolo; Padovani, Andrea; Bersuker, G. | |
A study on HfO2 RRAM in HRS based on I–V and RTN analysis | 1-gen-2014 | Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca | |
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis | 1-gen-2014 | Larcher, Luca; Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Vandelli, Luca; Bersuker, Gennadi | |
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory | 1-gen-2015 | Puglisi, Francesco Maria; Larcher, Luca; Padovani, Andrea; Pavan, Paolo | |
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM | 1-gen-2015 | Puglisi, Francesco Maria; Wenger, C.; Pavan, Paolo | |
A microscopic physical description of RTN current fluctuations in HfOx RRAM | 1-gen-2015 | Puglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca | |
Temperature impact on the reset operation in HfO2 RRAM | 1-gen-2015 | Puglisi, Francesco Maria; Qafa, Altin; Pavan, Paolo |
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