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Mostrati risultati da 1 a 20 di 128
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Random Telegraph Signal Noise Properties of HfOx RRAM in High Resistive States 1-gen-2012 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca; G., Bersuker
FHMM analysis for Multi-Defect Spectroscopy in HfOX RRAM 1-gen-2013 Puglisi, Francesco Maria; Pavan, Paolo
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS 1-gen-2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM 1-gen-2013 PUGLISI, Francesco Maria; PAVAN, Paolo
RTS Noise Characterization of HfOx RRAM in High Resistive State 1-gen-2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca; G., Bersuker
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory 1-gen-2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
Perimeter and area current components in HfO2 and HfO2-x metal-insulator-metal capacitors 1-gen-2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
An Empirical Model for RRAM Resistance in Low- and High-Resistance State 1-gen-2013 Puglisi, Francesco Maria; Larcher, Luca; G., Bersuker; Padovani, Andrea; Pavan, Paolo
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 1-gen-2014 Puglisi, Francesco Maria; Veksler, D.; Matthews, K.; Bersuker, G.; Larcher, Luca; Padovani, Andrea; Vandelli, Luca; Pavan, Paolo
Progresses in Modeling HfOx RRAM Operations and Variability 1-gen-2014 Larcher, Luca; Pirrotta, Onofrio; Puglisi, Francesco Maria; Padovani, Andrea; Pavan, Paolo; Vandelli, Luca
Factorial Hidden Markov Model analysis of Random Telegraph Noise in Resistive Random Access Memories 1-gen-2014 Puglisi, Francesco Maria; Pavan, Paolo
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS 1-gen-2014 Puglisi, Francesco Maria; Pavan, Paolo; Larcher, Luca; Padovani, Andrea
An investigation on the role of current compliance in HfO2-based RRAM in HRS using RTN and I-V data 1-gen-2014 Puglisi, Francesco Maria; Pavan, Paolo
Instability of HfO2 RRAM devices: Comparing RTN and cycling variability 1-gen-2014 Puglisi, Francesco Maria; Larcher, Luca; Pavan, Paolo; Padovani, Andrea; Bersuker, G.
A study on HfO2 RRAM in HRS based on I–V and RTN analysis 1-gen-2014 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 1-gen-2014 Larcher, Luca; Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Vandelli, Luca; Bersuker, Gennadi
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory 1-gen-2015 Puglisi, Francesco Maria; Larcher, Luca; Padovani, Andrea; Pavan, Paolo
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM 1-gen-2015 Puglisi, Francesco Maria; Wenger, C.; Pavan, Paolo
A microscopic physical description of RTN current fluctuations in HfOx RRAM 1-gen-2015 Puglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca
Temperature impact on the reset operation in HfO2 RRAM 1-gen-2015 Puglisi, Francesco Maria; Qafa, Altin; Pavan, Paolo
Mostrati risultati da 1 a 20 di 128
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