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Mostrati risultati da 1 a 20 di 318
Titolo Data di pubblicazione Autore(i) File
A new model for tunnelling conduction in ultra-thin dielectrics 1-gen-1998 Larcher, Luca; A., Paccagnella; A., Scarpa; G., Ghidini
New double-box model for SILC and tunnel current in ultra-thin MOS devices 1-gen-1998 Larcher, Luca; A., Paccagnella; A., Scarpa; G., Ghidini
A new model for tunneling conduction in ultra-thin dielectrics 1-gen-1998 Larcher, L.; Paccagnella, A.; Scarpa, A.; Ghidini, G.
New model of tunnelling current and SILC in ultra-thin oxides 1-gen-1998 Larcher, L.; Paccagnella, A.; Scarpa, A.; Ghidini, G.
Temperature dependence of stress induced leakage current in ultra-thin oxides 1-gen-1999 M., Ceschia; A., Paccagnella; A., Cester; Larcher, Luca; G., Ghidini
A model of radiation induced leakage current (RILC) in ultra-thin gate oxides 1-gen-1999 Larcher, Luca; A., Paccagnella; M., Ceschia; G., Ghidini
Radiation effects on floating-gate memory cells 1-gen-2001 G., Cellere; P., Pellati; P., Olivo; A., Chimenton; J., Wyss; Larcher, Luca; A., Paccagnella
A model of the stress induced leakage current in gate oxides 1-gen-2001 Larcher, Luca; A., Paccagnella; G., Ghidini
Impact of the As dose in 0.35 mu m EEPROM technology: characterization and modeling 1-gen-2001 N., Galbiati; G., Ghidini; C., Cremonesi; Larcher, Luca
A New Compact Model of Floating Gate Non-Volatile Memory Cells 1-gen-2001 Larcher, Luca; Pavan, Paolo; F., Gattel; L., Albani; A., Marmiroli
Gate current in ultrathin MOS capacitors: a new model of tunnel current 1-gen-2001 Larcher, Luca; A., Paccagnella; G., Ghidini
A new compact Spice-like model of E2PROM Memory cells suitable for DC and transient simulations 1-gen-2001 Larcher, Luca; Pavan, Paolo; Cuozzo, M.; Marmiroli, A.
A new model of gate capacitance as a simple tool to extract MOS parameters 1-gen-2001 Larcher, Luca; Pavan, Paolo; F., Pellizzer; G., Ghidini
Bias and W/L dependence of capacitive coupling coefficients in floating gate memory cells 1-gen-2001 Larcher, Luca; Pavan, Paolo; L., Albani; T., Ghilardi
A New Analytical Model of Channel Hot Electron (CHE) and CHannel Initiated Secondary ELectron (CHISEL) Current Suitable for Compact Modeling 1-gen-2002 Larcher, Luca; Pavan, Paolo
Single Event Charge Loss in EPROMs 1-gen-2002 G., Cellere; Larcher, Luca; J., Wyss; A., Candelori; P., Caprara; A., Paccagnella
A Complete Study of SILC Effects on EEPROM Reliability 1-gen-2002 Larcher, Luca; S., Bertulu; Pavan, Paolo
SILC effects on EEPROM memory cell reliability 1-gen-2002 Larcher, Luca; Bertulu, S.; Pavan, Paolo
Plasma-induced Micro Breakdown in small area MOSFETs 1-gen-2002 G., Cellere; Larcher, Luca; M. G., Valentini; A., Paccagnella
Micro breakdown in small-area ultra-thin gate oxide 1-gen-2002 Cellere, G.; Larcher, Luca; Valentini, M. G.; Paccagnella, A.
Mostrati risultati da 1 a 20 di 318
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